Tool supplier offers try before you buy

Power tool manufacturer Milwaukee Tools has opened a UK Experience Centre to enable trade customers to test equipment.

Advantest, NXP and Arizona State University Collaborate to Launch New Test Engineering Curriculum

Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) and Arizona State University (ASU) today announced their collaboration with global semiconductor company NXP® Semiconductors to create a new, “first-of-its-kind” test engineering course at ASU. Officially titled “EEE 522 Radio Frequency Test,” the course content was originally developed by faculty in the Ira A. Fulton Schools of Engineering at ASU and, through this […]

Advantest Announces Speaker Lineup and Program for VOICE 2023 Developer Conference, May 8-10

Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the featured speakers and topics for its VOICE 2023 Developer Conference, May 8-10, in Santa Clara, California. This year marks the 15th anniversary of the in-person VOICE event, which kicks off on Monday evening, May 8, with a welcome reception and the popular Technology Kiosk Showcase, […]

Advantest Opens Registration for International VOICE 2023 Developer Conference, May 9-10

Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has begun accepting registration from semiconductor test professionals around the world to participate in its VOICE 2023 Developer Conference, held on May 9-10, in Santa Clara, California. Under the theme “Beyond the Technology Horizon,” this year’s conference welcomes the international community of users and strategic partners […] The post <strong>Advantest Opens Registration for International VOICE 2023 Developer Conference, May 9-10</strong> appeared first on Civil + Structural Engineer magazine.

Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomask Defects

Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today unveiled the E5620 Defect Review Scanning Electron Microscope (DR-SEM), its newest mask SEM product for reviewing and classifying ultra-small defects on photomasks and mask blanks. With its high-accuracy, high-throughput defect review capability, the E5620 DR-SEM is expected to contribute appreciably to production quality improvements in […] The post Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomask Defects appeared first on Civil + Structural Engineer magazine.